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Reliability enhancement of embedded memory with combination of aging-aware adaptive in-field self-repair and ECC.
Gian Mayuga
Yuta Yamato
Tomokazu Yoneda
Yasuo Sato
Michiko Inoue
Published in:
ETS (2016)
Keyphrases
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software aging
embedded systems
image processing
image enhancement
memory usage
computing power
memory space
failure rate
data structure
low cost
main memory
memory requirements
computational power
age estimation