3D IC test scheduling using simulated annealing.
Chih-Yao HsuChun-Yi KuoJames Chien-Mo LiKrishnendu ChakrabartyPublished in: VLSI-DAT (2012)
Keyphrases
- simulated annealing
- scheduling problem
- tabu search
- test cases
- solution quality
- scheduling algorithm
- genetic algorithm
- information retrieval
- simulated annealing algorithm
- knowledge base
- evolutionary algorithm
- metaheuristic
- test data
- job shop
- real world
- integrated circuit
- resource allocation
- genetic algorithm ga
- information systems
- machine learning