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Measurements and analyses of substrate noise waveform in mixed signal IC environment.

Makoto NagataYoji KashimaDaisuke TamuraTakashi MorieAtsushi Iwata
Published in: CICC (1999)
Keyphrases
  • measurement noise
  • mixed signal
  • vlsi circuits
  • noisy environments
  • mobile robot
  • low power
  • integrated circuit
  • real time
  • high speed
  • signal to noise ratio
  • measurement errors
  • denoising
  • missing data
  • image enhancement