Sign in
A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing.
Néstor Eduardo Sánchez-Arriaga
Divya Tiwari
Windo Hutabarat
Adrian Leyland
Ashutosh Tiwari
Published in:
Sensors (2023)
Keyphrases
</>
low cost
thin film
grain size
film thickness
single image
real time
software engineering
cost effective
chemical vapor deposition
database
light scattering
case study
multi layer
software testing
room temperature
photometric stereo
viewpoint
artificial neural networks