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Optimized test circuits for SER characterization of a manufacturing process.

Peter HazuchaChrister Svensson
Published in: IEEE J. Solid State Circuits (2000)
Keyphrases
  • manufacturing process
  • quality control
  • process control
  • control system
  • manufacturing systems
  • product design
  • discrete event
  • knowledge acquisition
  • cooperative
  • fuzzy logic
  • product quality