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A new method for measuring alias-free aperture jitter in an ADC output.
Takahiro J. Yamaguchi
Katsuhiko Degawa
Masayuki Kawabata
Masahiro Ishida
Koichiro Uekusa
Mani Soma
Published in:
ITC (2015)
Keyphrases
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high accuracy
pairwise
experimental evaluation
computational cost
detection method
synthetic and real images
input data
significant improvement
support vector machine
high order
feature space
high resolution
cost function
dynamic programming
edge detection
synthetic data