Duplex: simultaneous parameter-performance exploration for optimizing analog circuits.

Seyed Nematollah Ahmadyan Shobha Vasudevan

Published in: ICCAD (2016)

Keyphrases

analog circuits
fault diagnosis
digital circuits
wavelet packet transform
simultaneous optimization
parameter values
input parameters
neural network
real time
pattern recognition
query processing
high speed
pattern matching
image processing
model checking
parameter settings
artificial intelligence
data sets