Login / Signup
Impacts of NBTI/PBTI and Contact Resistance on Power-Gated SRAM With High-kappa Metal-Gate Devices.
Hao-I Yang
Wei Hwang
Ching-Te Chuang
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2011)
Keyphrases
</>
power consumption
low power consumption
battery life
low power
power management
wide range
power saving
real time
cmos technology
data center
field effect transistors
metal oxide
database
high speed
data transmission
nm technology