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Simulation study on the lifetime of electrochemical capacitors using the accelerated degradation test under temperature and voltage stresses.
Yu Tack Kim
Kwang-Bum Kim
Yoo Eo Hyun
Ick-Jun Kim
Sunhye Yang
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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simulation study
room temperature
electric field
monte carlo
machine learning
test data
power system
energy consumption
short circuit
real time
neural network
genetic algorithm
high temperature
energy dissipation
duty cycle