Sign in
Post-silicon programmed body-biasing platform suppressing device variability in 45 nm CMOS technology.
Hiroaki Suzuki
Masanori Kurimoto
Tadao Yamanaka
Hidehiro Takata
Hiroshi Makino
Hirofumi Shinohara
Published in:
ISLPED (2008)
Keyphrases
</>
cmos technology
silicon on insulator
low power
spl times
low voltage
power consumption
parallel processing
high speed
power dissipation
real time
low cost
image sensor
image processing
multimedia
hardware and software