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Test generation at the algorithm-level for gate-level fault coverage.
Eduardas Bareisa
Vacius Jusas
Kestutis Motiejunas
Rimantas Seinauskas
Published in:
Microelectron. Reliab. (2008)
Keyphrases
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computational complexity
learning algorithm
dynamic programming
detection algorithm
preprocessing
k means
np hard
optimal solution
segmentation algorithm
test generation
computer vision
objective function
search space
expectation maximization
matching algorithm