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Test Derivation for SDN-Enabled Switches: A Logic Circuit Based Approach.
Jorge López
Natalia Kushik
Asma Berriri
Nina Yevtushenko
Djamal Zeghlache
Published in:
ICTSS (2018)
Keyphrases
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logic circuits
high speed
delay insensitive
digital circuits
logic synthesis
modal logic
defeasible logic
micron cmos
database
classical logic
logic programming
asynchronous circuits
test data
knowledge base
chip design
built in self test
artificial intelligence