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Impact of High-k Spacer on Device Performance of Nanoscale Underlap Fully Depleted SOI MOSFET.
Rajneesh Sharma
Rituraj S. Rathore
Ashwani K. Rana
Published in:
J. Circuits Syst. Comput. (2018)
Keyphrases
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high impact
wide range
information systems
multimedia
data structure
database
real time
databases
data mining
computer vision
case study
low cost
image quality
small size
negatively affect