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Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!).

Charles E. StroudSrinivasa KonalaPing ChenMiron Abramovici
Published in: VTS (1996)
Keyphrases
  • built in self test
  • integrated circuit
  • neural network
  • search engine
  • image sequences
  • computational complexity
  • logic programming
  • hardware implementation