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Overdriving reliability of chip scale packaged LEDs: Quantitatively analyzing the impact of component.
Hongyu Tang
Huaiyu Ye
Cell K. Y. Wong
Stanely Y. Y. Leung
Jiajie Fan
Xianping Chen
Xuejun Fan
Guoqi Zhang
Published in:
Microelectron. Reliab. (2017)
Keyphrases
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low cost
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ground truth
neural network
data mining
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physical design
data sets
image processing
power consumption
software components
highly reliable
reliability analysis
analog vlsi
functional verification