Trimming Feature Extraction and Inference for MCU-Based Edge NILM: A Systematic Approach.
Enrico TabanelliDavide BrunelliAndrea AcquavivaLuca BeniniPublished in: IEEE Trans. Ind. Informatics (2022)
Keyphrases
- feature extraction
- preprocessing
- feature vectors
- discriminant analysis
- bayesian networks
- principal component analysis
- feature space
- dimensionality reduction
- texture analysis
- pattern classification
- frequency domain
- manifold learning
- probabilistic inference
- structured prediction
- qualitative and quantitative
- random fields
- linear feature extraction
- inference process
- feature extractor
- feature extractors
- computer vision
- linear discriminant analysis
- image processing
- wavelet transform
- image classification
- edge detector
- feature set
- edge detection
- face images
- weighted graph
- edge information
- inference engine
- image features
- defect detection
- inference mechanism
- multiscale
- image preprocessing
- face recognition