Test for more than pass/fail using on-chip temperature sensor.

Chih-Wea Wang Chen-Tung Lin Chun-Chieh Hsu Ching-Tung Wu Chi-Feng Wu

Published in: VLSI-DAT (2012)

Keyphrases

real time
sensor networks
high speed
sensor data
low cost
video sequences
cmos image sensor
test cases
multi sensor
high density
statistical significance
image sensor
circuit design
high sensitivity