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A comparative analysis of tunneling FET circuit switching characteristics and SRAM stability and performance.

Yin-Nien ChenMing-Long FanVita Pi-Ho HuMing-Fu TsaiChia-Hao PaoPin SuChing-Te Chuang
Published in: ESSDERC (2012)
Keyphrases
  • power consumption
  • high speed
  • tunnel diode
  • database
  • low voltage
  • real time
  • neural network
  • cmos technology
  • asymptotic stability
  • power reduction