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BIST-Assisted Tuning Scheme for Minimizing IO-Channel Power of TSV-Based 3D DRAMs.

Yun-Chao YouChi-Chun YangJin-Fu LiChih-Yen LoChao-Hsun ChenJenn-Shiang LaiDing-Ming KwaiYung-Fa ChouCheng-Wen Wu
Published in: ATS (2014)
Keyphrases
  • highly efficient
  • multi channel
  • power consumption
  • channel capacity
  • neural network
  • control system
  • fine tuning