A one-pass test-selection method for maximizing test coverage.

Cheng Xue R. D. (Shawn) Blanton

Published in: ICCD (2015)

Keyphrases

test data
high accuracy
detection method
prior knowledge
dynamic programming
experimental evaluation
objective function

preprocessing
clustering method
theoretical analysis
selection scheme
high precision
detection algorithm
support vector machine

cost function
pairwise
model selection
optimization algorithm
artificial neural networks
computational complexity
error rate

test cases
similarity measure
genetic algorithm
fully automatic
selection algorithm
data sets