A one-pass test-selection method for maximizing test coverage.
Cheng XueR. D. (Shawn) BlantonPublished in: ICCD (2015)
Keyphrases
- test data
- high accuracy
- detection method
- prior knowledge
- dynamic programming
- experimental evaluation
- objective function
- preprocessing
- clustering method
- theoretical analysis
- selection scheme
- high precision
- detection algorithm
- support vector machine
- cost function
- pairwise
- model selection
- optimization algorithm
- artificial neural networks
- computational complexity
- error rate
- test cases
- similarity measure
- genetic algorithm
- fully automatic
- selection algorithm
- data sets