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A perturbation based fault modeling and simulation for mixed-signal circuits.

Naim Ben-HamidaKhaled SaabDavid MarcheBozena Kaminska
Published in: Asian Test Symposium (1997)
Keyphrases
  • mixed signal
  • vlsi circuits
  • low power
  • multi channel
  • fault detection
  • simulation model
  • fault diagnosis
  • digital images
  • high speed
  • power consumption
  • digital circuits
  • low voltage