Quadratic Statistical MAX Approximation for Parametric Yield Estimation of Analog/RF Integrated Circuits.
Xin LiYaping ZhanLawrence T. PileggiPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2008)
Keyphrases
- integrated circuit
- parametric models
- statistically sound
- semi parametric
- gaussian markov random fields
- update equations
- electron beam
- statistical analysis
- importance sampling
- computational complexity
- maximum likelihood estimation
- statistical models
- estimation algorithm
- statistical inference
- parameter estimation
- approximation methods
- relevance feedback
- approximation error
- radio frequency
- vlsi architecture
- information geometry
- image analysis
- pairwise
- objective function