Breakdown Voltage Shift of CMOS Buried Quad Junction (BQJ) Detector.
Thais Luana Vidal de Negreiros da SilvaGuo-Neng LuPatrick PittetPublished in: DCIS (2018)
Keyphrases
- low voltage
- power supply
- charge coupled device
- leakage current
- design considerations
- high speed
- high voltage
- random access memory
- power system
- low power
- analog vlsi
- power consumption
- circuit design
- low cost
- image sensor
- detection algorithm
- cmos technology
- vlsi circuits
- power losses
- real time
- electric field
- feature detectors
- operating conditions
- digital camera
- detection method
- computer vision