RF test accuracy and capacity enhancement on ATE for silicon TV tuners.

Y. Fan A. Verma Y. Su L. Rose J. Janney V. Do S. Kumar

Published in: ITC (2016)

Keyphrases

high accuracy
prediction accuracy
computational cost
image processing
low cost
error rate
highly accurate
classification accuracy
image enhancement
computational efficiency
fold cross validation
false positive and false negative
neural network
test data
statistical significance
gallium arsenide