On Effective IDDQ Testing of Low Voltage CMOS Circuits Using Leakage Control Techniques.

Zhanping Chen Liqiong Wei Kaushik Roy

Published in: ISQED (2000)

Keyphrases

low voltage
cmos technology
random access memory
leakage current
power line
design considerations
power management
analog vlsi
delay insensitive
circuit design
real time
correlation analysis
parallel processing
power consumption
high speed
low cost
control system