Optimization of a cycle time and utilization in semiconductor test manufacturing using simulation based, on-line, near-real-time scheduling system.
Appa Iyer SivakumarPublished in: WSC (1999)
Keyphrases
- optimal design
- semiconductor manufacturing
- manufacturing systems
- production planning
- database systems
- test data
- quality control
- wafer fabrication
- data sets
- production line
- software testing
- statistical significance
- optimization process
- test cases
- optimization problems
- simulated annealing
- evolutionary algorithm
- machine learning