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Power-aware SoC test planning for effective utilization of port-scalable testers.

Anuja SehgalSudarshan BahukudumbiKrishnendu Chakrabarty
Published in: ACM Trans. Design Autom. Electr. Syst. (2008)
Keyphrases
  • test cases
  • decision support
  • database
  • power consumption
  • data mining
  • decision making
  • high quality
  • planning problems
  • low power