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A Fast and Accurate Gate-Level Transient Fault Simulation Environment.
Hungse Cha
Elizabeth M. Rudnick
Gwan S. Choi
Janak H. Patel
Ravishankar K. Iyer
Published in:
FTCS (1993)
Keyphrases
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simulation environment
simulation tool
simulation model
high accuracy
computationally efficient
levels of abstraction
high quality
fault detection
simulation tools
higher level
steady state
highly accurate
virtual space
nano scale