Methods to reduce test application time for accumulator-based self-test.
Albrecht P. StroeleFrank MayerPublished in: VTS (1997)
Keyphrases
- statistical tests
- significant improvement
- computationally expensive
- machine learning methods
- statistical significance
- artificial intelligence
- real time
- artificial neural networks
- experimental design
- test data
- probabilistic model
- search algorithm
- video sequences
- database systems
- image segmentation
- knowledge base
- information systems
- data sets