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A smart test controller for scan chains in secure circuits.
Jean DaRolt
Giorgio Di Natale
Marie-Lise Flottes
Bruno Rouzeyre
Published in:
IOLTS (2013)
Keyphrases
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real time
control system
neural network
pid controller
matlab simulation
built in self test
reinforcement learning
high speed
lightweight
test cases
optimal control
key management
cryptographic protocols
analog circuits
logic synthesis