A smart test controller for scan chains in secure circuits.

Jean DaRolt Giorgio Di Natale Marie-Lise Flottes Bruno Rouzeyre

Published in: IOLTS (2013)

Keyphrases

real time
control system
neural network
pid controller
matlab simulation
built in self test
reinforcement learning
high speed
lightweight
test cases
optimal control
key management
cryptographic protocols
analog circuits
logic synthesis