On random testing for combinational circuits with a high measure of confidence.

Sunil R. Das Wen-Ben Jone

Published in: IEEE Trans. Syst. Man Cybern. (1992)

Keyphrases

confidence measure
wide range
logic circuits
distance measure
similarity measure
high precision
artificial intelligence
high speed
test set
test data
correlation coefficient
confidence level
high level synthesis
data sets
logic synthesis
circuit design
information theory
image quality
databases