Login / Signup

A Methodology for Calculating the Undetectable Double-Faults in Self-Checking Circuits.

Spiridon NikolaidisE. KaraolisAthanasios KakarountasKyriakos PapadomanolakisConstantinos E. Goutis
Published in: J. Circuits Syst. Comput. (2003)
Keyphrases
  • high speed
  • fault diagnosis
  • fault detection
  • built in self test
  • neural network
  • social networks
  • information systems
  • model based diagnosis
  • root cause
  • database
  • information retrieval
  • search algorithm
  • vlsi circuits