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A Methodology for Calculating the Undetectable Double-Faults in Self-Checking Circuits.
Spiridon Nikolaidis
E. Karaolis
Athanasios Kakarountas
Kyriakos Papadomanolakis
Constantinos E. Goutis
Published in:
J. Circuits Syst. Comput. (2003)
Keyphrases
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high speed
fault diagnosis
fault detection
built in self test
neural network
social networks
information systems
model based diagnosis
root cause
database
information retrieval
search algorithm
vlsi circuits