Login / Signup

Impact of Process Variations on Pulsed Flip-Flops: Yield Improving Circuit-Level Techniques and Comparative Analysis.

Marco LanuzzaRaffaele De RoseFabio FrustaciStefania PerriPasquale Corsonello
Published in: PATMOS (2010)
Keyphrases
  • comparative analysis
  • high speed
  • pattern recognition
  • user interface
  • image analysis
  • control system
  • fuzzy sets
  • flip flops