Login / Signup
Effect of Gate Oxide Defects on Tunnel Transistor RF Performance.
Markus Hellenbrand
Elvedin Memisevic
Johannes Svensson
A. Krishnaraja
Erik Lind
Lars-Erik Wernersson
Published in:
DRC (2018)
Keyphrases
</>
leakage current
silicon dioxide
low voltage
electrical properties
high speed
field effect transistors
power line
data sets
information retrieval
relevance feedback
image processing
low power
printed circuit boards