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On Using Implied Values in EDT-based Test Compression.

Marcin GebalaGrzegorz MrugalskiNilanjan MukherjeeJanusz RajskiJerzy Tyszer
Published in: DAC (2014)
Keyphrases
  • image compression
  • data compression
  • data sets
  • data mining
  • test data
  • compression ratio
  • parameter values
  • computer vision
  • data structure
  • statistically significant
  • statistical significance
  • lookup table