Time-Resolved Spectroscopic Temperature Measurement of Break Arcs in a D.C.42 V Resistive Circuit.
Junya SekikawaNaoki MoriyamaTakayoshi KubonoPublished in: IEICE Trans. Electron. (2008)
Keyphrases
- transient response
- high speed
- analog circuits
- line segments
- circuit design
- data sets
- temperature control
- analog vlsi
- expert systems
- artificial neural networks
- data acquisition
- high density
- case study
- measurement data
- measurement model
- genetic algorithm
- information retrieval
- neural network
- relative humidity
- duty cycle
- real time