Source-Synchronous Testing of Multilane PCI Express and HyperTransport Buses.

David C. Keezer Dany Minier Patrice Ducharme

Published in: IEEE Des. Test Comput. (2006)

Keyphrases

data mining
high speed
databases
neural network
machine learning
information retrieval
search engine
image segmentation
multiscale
cooperative
evolutionary algorithm
probabilistic model
test data
statistical tests
multiple sources