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Analyzing Fault Models for Reversible Logic Circuits.

Jing ZhongJon C. Muzio
Published in: IEEE Congress on Evolutionary Computation (2006)
Keyphrases
  • logic circuits
  • fault models
  • low power
  • functional decomposition
  • tunnel diode
  • model based diagnosis
  • gate array
  • real time
  • fault model
  • logic synthesis
  • low cost
  • power consumption
  • fault tolerant
  • fault management