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Negative bias temperature instability modeling for high-voltage oxides at different stress temperatures.

Robert EntnerTibor GrasserOliver TrieblHubert EnichlmairRainer Minixhofer
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • high voltage
  • operating conditions
  • positive and negative
  • thermal conductivity
  • real time
  • electric field
  • genetic programming
  • normal operation