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Reduce Yield Loss in Delay Defect Detection in Slack Interval.

Haihua YanAdit D. Singh
Published in: Asian Test Symposium (2004)
Keyphrases
  • defect detection
  • global exponential stability
  • significantly reduced
  • feature extraction
  • neural network
  • interval data
  • textured surfaces
  • loss probability
  • automated visual inspection