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New digital circuit techniques for total standby leakage reduction in nano-scale SOI technology.

Koushik K. DasRajiv V. JoshiChing-Te ChuangPeter W. CookRichard B. Brown
Published in: ESSCIRC (2003)
Keyphrases
  • nano scale
  • digital circuits
  • case study
  • key technologies
  • computer systems
  • rapid development
  • data mining
  • e learning
  • np hard
  • data processing
  • power consumption
  • finite state machines