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Design for Delay Fault Testability of 2-Rail Logic Circuits.

Kentaroh KatohKazuteru NambaHideo Ito
Published in: IEICE Trans. Inf. Syst. (2009)
Keyphrases
  • logic circuits
  • power dissipation
  • functional decomposition
  • low power
  • logic synthesis
  • high speed
  • real time
  • design process
  • gate array
  • computer vision
  • case study
  • fuzzy logic
  • input output