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A dynamic test compaction method on low power test generation based on capture safe test vectors.
Toshinori Hosokawa
Atsushi Hirai
Hiroshi Yamazaki
Masayuki Arai
Published in:
DFT (2017)
Keyphrases
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test generation
low power
power consumption
low cost
test cases
high speed
test sequences
video sequences
relational databases
error rate
software testing