Scan power reduction in linear test data compression scheme.
Mingjing ChenAlex OrailogluPublished in: ICCAD (2009)
Keyphrases
- test data
- compression scheme
- power reduction
- image compression
- data compression
- compression ratio
- test set
- test cases
- training data
- power consumption
- low power
- compression algorithm
- power saving
- training set
- low cost
- image quality
- data sets
- high quality
- training and test data
- wavelet transform
- multiscale
- feature extraction
- feature selection
- computer vision