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NBTI Reliability of PFETs under Post-Fabrication Self-Improvement Scheme for SRAM.

Nurul Ezaila AliasAnil KumarTakuya SarayaShinji MiyanoToshiro Hiramoto
Published in: IEICE Trans. Electron. (2013)
Keyphrases
  • significant improvement
  • high density
  • database
  • integrated circuit
  • real time
  • power consumption
  • data sets
  • databases
  • neural network
  • genetic algorithm
  • representation scheme
  • highly reliable
  • reliability analysis