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Trades-off between lithography line edge roughness and error-correcting codes requirements for NAND Flash memories.

Pavel PoliakovPieter BlommeAlessandro Vaglio PretMiguel Corbalan MirandaRoel GronheidDiederik VerkestJan Van HoudtWim Dehaene
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • error correcting codes
  • edge detection
  • error correction
  • error correcting
  • minimum distance
  • lower bound
  • low complexity
  • decoding algorithm