Mining IC test data to optimize VLSI testing.
Tony FountainThomas G. DietterichBill SudykaPublished in: KDD (2000)
Keyphrases
- test data
- test cases
- test set
- training data
- search based testing
- testing process
- data sets
- training set
- training and test data
- error rate
- text mining
- small number
- integrated circuit
- white box
- data mining
- object oriented
- knowledge discovery
- active learning
- software testing
- unseen data
- relational databases
- machine learning