Mining IC test data to optimize VLSI testing.

Tony Fountain Thomas G. Dietterich Bill Sudyka

Published in: KDD (2000)

Keyphrases

test data
test cases
test set
training data
search based testing
testing process

data sets
training set
training and test data
error rate
text mining
small number

integrated circuit
white box
data mining
object oriented
knowledge discovery

active learning
software testing
unseen data
relational databases
machine learning