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Switching constraint-driven thermal and reliability analysis of Nanometer designs.

Srini KrishnamoorthyVishak VenkatramanYuri ApanovichThomas BurdAnand Daga
Published in: ISQED (2011)
Keyphrases
  • reliability analysis
  • power plant
  • infrared
  • electron microscopy
  • condition monitoring
  • fault tree
  • real world
  • decision trees
  • multi objective
  • genetic programming
  • logistic regression