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Characterization and reliability of III-V gate-all-around MOSFETs.
Mengwei Si
SangHoon Shin
Nathan J. Conrad
Jiangjiang Gu
Jingyun Zhang
Muhammad Ashraful Alam
Peide D. Ye
Published in:
IRPS (2015)
Keyphrases
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reliability analysis
neural network
nano scale
data sets
machine learning
information systems
image segmentation
lower bound
software reliability
liquid crystal displays