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Characterization and reliability of III-V gate-all-around MOSFETs.

Mengwei SiSangHoon ShinNathan J. ConradJiangjiang GuJingyun ZhangMuhammad Ashraful AlamPeide D. Ye
Published in: IRPS (2015)
Keyphrases
  • reliability analysis
  • neural network
  • nano scale
  • data sets
  • machine learning
  • information systems
  • image segmentation
  • lower bound
  • software reliability
  • liquid crystal displays