On Identifying Don't Care Inputs of Test Patterns for Combinational Circuits.

Seiji Kajihara Kohei Miyase

Published in: ICCAD (2001)

Keyphrases

long term
asynchronous circuits
pattern discovery
high speed
built in self test
logic circuits
frequent patterns
pattern analysis
health care
similar patterns
interesting patterns
pattern mining
data sets
training data
information systems
genetic algorithm
information retrieval